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使用高浓缩同位素的152Sm和154Sm配制不同丰度的Sm基准溶液,对多接收电感耦合等离子体质谱(MC-ICPMS)的系统偏差进行校准,求出154Sm/152Sm的平均校准系数。采用指数函数式推算出其它同位素比的校准系数。对天然样品的测量结果进行校正,并与表面热电离质谱的测量结果进行了比较,主同位素对的丰度比误差小于0.03%。实验结果表明,MC-ICPMS测量的影响因素多,系统偏差较大,但是通过校正可以获得与表面热电离质谱一致的测量结果。通过实验,建立了MC-ICPMS的同位素丰度绝对测量方法。
Using 152Sm and 154Sm of highly concentrated isotopes to prepare different abundances of Sm reference solution, the system deviation of MC-ICPMS was calibrated to find the average calibration coefficient of 154Sm / 152Sm. The exponential function is used to calculate the calibration coefficients for other isotope ratios. The measurement results of natural samples were corrected and compared with the results of surface thermal ionization mass spectrometry. The abundances of major isotope pairs were less than 0.03%. The experimental results show that MC-ICPMS has many influencing factors and large systematic deviations, but the measurement results consistent with surface thermal ionization mass spectrometry can be obtained through calibration. Through experiments, the absolute isotope abundance measurement method of MC-ICPMS was established.