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本文阐明用背散射进行物质分析的原理和实验方法。用1MeV的~4He离子对钛合金注入銦离子的背散射谱进行了分析研究,证实离子注入有可能成为提高材料耐磨性的一种新方法。
This article illustrates the principles and experimental methods for material analysis using backscatter. The backscattering spectra of indium ions implanted with titanium ions were analyzed by using 1MeV ~ 4He ions, which proved that ion implantation may become a new method to improve the wear resistance of the material.