颅面部硬组织的X线头影测量技术创立于三十年代,已成为研究颅颌面骨骼结构形态、生长发育及错(牙合)机制分析的重要手段。自五十年代末起,不少学者致力于软组织侧貌的X 线头影测量研究,使其成为与硬组织X线头影测量几乎同等重要的研究手段及临床分析方法。在错(牙合)矫治的临床实践中,软组织外形及 Cranial and facial hard tissue X-ray Cephalometric measurement technology was founded in the thirties, has become a study of craniofacial bone structure morphology, growth and development and malocclusion mechanism of important means. Since the late 1950s, many scholars have devoted themselves to the investigation of the soft tissue contour of the cephalometric study, making it an almost as important research method and clinical analysis method as the hard tissue X-cephalometry. In the wrong (occlusal) orthodontic clinical practice, the soft tissue shape and