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随着数字集成电路性能的不断提高,数字集成电路测试系统也相应得到了迅速发展。主要表现在以下几方面: 测试通道数增加数字电路集成度的不断提高和专用集成电路的出现,器件的引脚数不断增加,使得数字测试系统的测试通道数相应不断增加。由测试中、小规模集成电路的24通道测试系统,测试大规模集成电路的48通道、64通道测试系统发展到测试超大规模集成电路的128通道、256通道甚至更多通道数的测试系统。如日本Advantest公司的VL-
With the continuous improvement of the performance of digital integrated circuits, digital integrated circuit test system has also been the rapid development. Mainly in the following areas: Increasing the number of test channels Increasing the degree of digital circuit integration and the emergence of ASICs, the device pin number continues to increase, making the digital test system, the corresponding increase in the number of test channels. From the test, small-scale integrated circuit 24-channel test system, test LSI 48-channel, 64-channel test system developed to test the VLSI 128-channel, 256-channel or more channel number of test systems. Such as Japan Advantest’s VL-