日本国立高能物理实验室的两个研究小组利用同步加速器辐射实验装置建立了一种新的分析技术,它能有效地研究半导体材料中痕量杂质和组分的结构状态。该设备是一台能产生白光的大型装置,白光包括从可见光到X-射线范围的波长。目前,大学、 Two research groups at Japan’s National High Energy Physics Laboratory used a synchrotron radiation experimental setup to create a new analytical technique that can effectively study the structural state of trace impurities and components in semiconductor materials. The device is a large device that produces white light, including white light from visible light to X-ray wavelength range. At present, universities,