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用 RIA法、EL ASAI等方法测定 92例 2型糖尿病并血管并发症患者、90例单纯 2型糖尿病患者及 40例正常人的血浆 ET、NO、IAI等指标并进行比较。结果 :2型糖尿病并血管并发症组较单纯 2型糖尿病组及正常对照组IAI显著降低 ,血浆 ET水平升高 ,NO水平降低 ,IAI与 ET水平呈负相关 ,与 NO呈正相关 ,ET与 NO呈负相关。结论 :胰岛素抵抗、血浆 ET水平升高、NO水平降低与 2型糖尿病血管并发症的发生、发展关系密切
The plasma ET, NO, IAI and other indexes of 92 patients with type 2 diabetes mellitus and vascular complications, 90 patients with simple type 2 diabetes mellitus and 40 normal subjects were measured by RIA and EL ASAI. Results: The IAI in type 2 diabetes mellitus and vascular complications group were significantly lower than those in type 2 diabetes mellitus group and normal control group. The levels of ET and plasma ET were decreased, while the levels of IAI and ET were negatively correlated with IAI. The levels of ET and NO Negative correlation. Conclusion: Insulin resistance, elevated plasma ET level and decreased NO levels are closely related to the occurrence and development of type 2 diabetic vascular complications