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介绍了中波和长波“红外小光点扫描测试系统”。该系统由红外聚焦光学子系统、六维精密扫描工件台及数据采集子系统构成。可用于红外焦平面器件重要性能参数如串音、响应均匀性、转移效率的测量，也可用于单元红外探测器有效响应面积和响应均匀性等参数的测量。
Introduced the medium wave and long wave “infrared small spot scanning test system.” The system consists of infrared focusing optical subsystem, six-dimensional precision scanning of the workpiece table and data acquisition subsystem. Can be used for infrared focal plane device important performance parameters such as crosstalk, response uniformity, transfer efficiency measurement can also be used for unit infrared detector effective response area and response uniformity and other parameters of the measurement.