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一、引言我们曾与某厂的同志一道,用“加速寿命试验”的方法对硅稳压二极管2CW_2的可靠性作了考查,其中主要的一项实验是“高温贮存加速寿命试验”。选取的温度为100、125、150、175、200和225℃共六组,每组分别存放受试元件100或200只,试验连续进行了五千小时。我们采用图估计法处理实验数据,计算了分布参数和失效激活能,预测了在正常温度下的寿命。实验结果表明,这批元件的累积失效率基本上服从威布尔分布。
I. INTRODUCTION We worked with the comrades of a factory to examine the reliability of silicon Zener diode 2CW_2 with the method of “accelerated life test”. One of the main experiments was “High-temperature Storage Accelerated Life Test.” The selected temperature was 100,125,150,175,200 and 225 ℃ total of six groups, each group were stored test components 100 or 200, the test carried out continuously for 5,000 hours. We used the graph estimation method to process the experimental data, calculated the distribution parameters and the failure activation energy, and predicted the life at normal temperature. Experimental results show that the cumulative failure rate of these components basically obeys Weibull distribution.