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本文提出了一种适用于微程序控制的测试图案发生器的指令存储器结构,在此基础上研制成功了几种测试图案发生器,并对该种高速存储器测试图案发生器进行了分析和讨论。
This paper presents an instruction memory structure suitable for the test pattern generator of micro-program control. Based on this, several test pattern generators are successfully developed, and the high-speed memory test pattern generator is analyzed and discussed.