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利用六面顶高压设备制备了高密度、低脆性、纳米级的ZnO块体材料,用MDI/JADE5X射线衍射仪(Cu靶)和XL30S-FEG场发射扫描电子显微镜对高压样品的相组成、晶粒尺寸及微观形貌进行了表征.利用E55+FRA106/5傅里叶变换激光拉曼光谱仪通过ZnO块体样品位于50—500cm-1之内的拉曼光谱,研究了极性半导体纳米材料的拉曼光谱学特征.发现在极性半导体ZnO纳米块体材料中,没有出现明显的尺寸限制效应.
High-density, low-friability, nano-sized ZnO bulk materials were prepared by six-sided high-pressure equipment. The phase composition and crystal structure of high-pressure samples were characterized by using MDI / JADE5X ray diffractometer (Cu target) and XL30S-FEG field emission scanning electron microscope Particle size and morphology were characterized.The Raman spectra of ZnO block samples in the range of 50-500 cm-1 were obtained by E55 + FRA106 / 5 Fourier Transform Laser Raman Spectroscopy Raman spectroscopy and found no significant size-limiting effect in polar semiconductor ZnO nanoblocks.