本文应用统计分析方法（t检验、相关、逐步回归等分析法）对绘人测验、中国比奈和韦氏量表进行显著性检验、相关性和多元回归分析。结果表明：三种智能测验所得智商均数无显著性差异．分布范围大致相同；同时证明三种量表间有高度相关性．并存在一定的函数关系。说明了这三种量表都能反映儿童智力发展水平．但在实际应用中．应注意其着重点。 In this paper, statistical analysis methods (t test, correlation, stepwise regression analysis) on the paint test, the Chinese Bina and Wechsler scales were tested, correlation and multiple regression analysis. The results showed that there was no significant difference in IQ between the three intelligence tests. The distribution range is roughly the same; at the same time, there is a high degree of correlation between the three scales. And there is a certain functional relationship. It shows that all three scales can reflect the level of children’s mental development. But in practical application. Should pay attention to its focus.