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The reflection Talbot effect under the illumination of Gaussian spherical wave and plane wave is observed on 1D and 2D photonic crystal of silicon prepared by nanosecond laser. It is found that the distance between two adjacent Talbot images increases lineally with increasing of image distance as well as amplification of Talbot images under the illumination of Gaussian spherical wave. The result of theory is coincident with that of experiment, which shows that selecting suitable wavefront shape of input field can enlarge the amplification rate and improve the resolution of Talbot imaging. The reflection Talbot effect will have a lot of good application in microscopy of micro-fabrication on silicon, such as detecting period structures of plasma on line of PLD fabricating.
The reflection Talbot effect under the illumination of Gaussian spherical wave and plane wave is observed on 1D and 2D photonic crystal of silicon prepared by nanosecond laser. It is found that the distance between two adjacent Talbot images increases lineally with increasing of image distance as well as amplification of Talbot images under the illumination of Gaussian spherical wave. The result of theory is coincident with that of experiment, which shows that select suitable wavefront shape of input field can enlarge the amplification rate and improve the resolution of Talbot imaging. The reflection Talbot effect will have a lot of good application in microscopy of micro-fabrication on silicon, such as detecting period structures of plasma on line of PLD fabricating.