Al/Ge薄膜中斑图(pattern)的形成是一种非平衡生长现象,随着非线性科学的发展,近年来这方面的工作引起了人们极大的兴趣.较有代表性的工作如Deutscher和Lereah在原位退火Al-Ge非晶合金膜时发现的密集分叉形貌(Dense branching morphology),Sanchez等人观察到的多标度分形生长等.由于非线性系统对初始生长条件、边界条件细微变化固有的敏感性,不同形貌班图精确的形成条件是难以预测的,即使在相同的实验条件下,可能观察到 The formation of patterns in Al / Ge films is an unbalanced growth phenomenon, and with the development of nonlinear science, the work in this field has drawn great interest in recent years.More representative works such as Deutscher And Lereah in situ annealing Al-Ge amorphous alloy film found when the dense branched morphology (Dense branching morphology), Sanchez et al observed multi-scale fractal growth, etc. Due to the initial growth conditions of non-linear system, the boundary The inherent sensitivity of subtle variations in conditions, the precise formation conditions for different topographies are unpredictable, even under the same experimental conditions