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就当前国内外主要的专利计量指标,从适用性的角度将其划分为宏观、中观和微观三个层次,并就其计算方法和表征意义进行详细介绍。通过分析发现,专利指标主要从量、率和质的角度,体现宏观技术领域、中观具体企业和微观专利文献方面的差异。最后,对当前专利计量指标应用过程中存在的一些问题进行探讨,尤其是对我国专利计量中存在的一些独特问题进行较为深入的剖解,希望可以对相关政策制定和产业布局规划提供一定的参考。
At present, the main domestic and international patent measurement indexes are divided into three levels of macroscopic, meso-level and microcosmic from the angle of applicability, and their calculation methods and characterization significance are introduced in detail. Through the analysis, it is found that the indexes of patents mainly reflect the differences in macroscopic technical fields, medium-sized specific enterprises and micro-patent documents from the aspects of quantity, rate and quality. Finally, some problems existing in the process of the application of the current patent metrology index are discussed. Especially, some unique problems existing in the patent metering of our country are analyzed in more depth. I hope that it can provide reference for the related policy making and industrial layout planning.