在生产诸如存贮器芯片和微处理机等数字器件时,大规模集成电路(LSI)的测试费用占总成本的很大一部分。对于较早期的小规模和中规模集成电路来说,制造商花不多的经费就能详尽地检测电路中各种可能的工作状态;但是,对于大规模或超大规模集成电路(VLSI)来说,由于器件的工作状 In the production of digital devices such as memory chips and microprocessors, the cost of testing large-scale integrated circuits (LSIs) is a significant part of the total cost. For earlier small- and medium-scale integrated circuits, the manufacturer can exhaustively detect every possible state of operation in the circuit with little effort; however, for large or very large scale integrated circuits (VLSIs) , Due to the work of the device