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测量EMI在片上电源分配网络中的二维分布,对研究集成电路的电磁抗扰性非常重要,能用于验证电磁抗扰模型的正确性。提出的片上电磁干扰感应阵列(OCEMISA)是一种测量EMI在电源分配网络上二维分布的测量方法。OCEMISA包含数个感应单元,在电源分配网络上产生开关噪声作为反馈信号,其频率各不相等,且只受局部电源电压的影响。用频谱分析仪经由电源引脚探测反馈信号,观察其特征频率随EMI的变化,计算感应单元所在位置EMI的电压分量,并采用FPGA验证OCEMISA的基本功能。
Measurement of EMI in the on-chip power distribution network in the two-dimensional distribution of integrated circuits for the study of electromagnetic immunity is very important, can be used to verify the correctness of the electromagnetic interference model. The proposed on-chip EMI induction array (OCEMISA) is a measure of the two-dimensional distribution of EMI over the power distribution network. OCEMISA consists of several sensing units that generate switching noise on the power distribution network as a feedback signal that varies in frequency and is only affected by the local supply voltage. The spectrum analyzer detects the feedback signal via the power pin, observes the change of its characteristic frequency with EMI, calculates the voltage component of the EMI of the sensing unit, and verifies the basic functions of OCEMISA by FPGA.