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目的探讨电子线路板粉末亚慢性经口暴露对SD大鼠的毒性损伤。方法将雌、雄SD大鼠分别随机分为A、B、C、D 4个组。A和D组16只,B和C组12只,A和D组各保留4只进行亚慢性试验后的45 d恢复试验。A组给予正常饲料作为对照,B、C、D 3组给予在每千克基础粉料中分别加入电子线路板粉末10、20和50 g混合均匀所制成的饲料,自由摄食饮水,自然光照。饲养90 d后,计算各组大鼠主要的脏器系数,检测血液生化指标,测定大鼠45、90 d和恢复45 d后血清中三碘甲状腺原氨酸(T3)、甲状腺素(T4)和睾酮(T)的含量。结果电子线路板粉末各剂量组与对照组的体重变化比较,差异无统计学意义;雌鼠高剂量组生化指标与对照组比较,差异有统计学意义(P<0.05),中、高剂量组肝脏脏器系数显著升高(P<0.01);45和90 d各组大鼠血清T3、T4和T含量均显著高于对照组(P<0.05),其中低剂量组升高最为明显,恢复45 d后高剂量组血清T3、T4和T与对照组相比,差异无统计学意义。结论电子线路板粉末亚慢性经口暴露可引发大鼠肝脏损伤,升高血清T3、T4和T的含量。
Objective To investigate the toxicity of electronic circuit board sub-chronic oral exposure to SD rats. Methods Female and male SD rats were randomly divided into A, B, C and D groups. 16 in Groups A and D, 12 in Groups B and C, and 4 in Groups A and D each retained a 45-day recovery test following sub-chronic testing. Group A received normal feed as control. Groups B, C and D were fed with a mixture of 10, 20 and 50 g of electronic circuit board powder per kg of base powder, respectively. After feeding for 90 days, the main organ coefficients of rats in each group were calculated and the blood biochemical indexes were measured. Serum levels of triiodothyronine (T3), thyroxine (T4) And testosterone (T) content. Results There was no significant difference in body weight between electronic dose powder and control group. The biochemical indexes of high dose group were significantly different from those of control group (P <0.05), medium and high dose group (P <0.01). The contents of T3, T4 and T in serum of rats in 45th and 90th days were significantly higher than those in control group (P <0.05), especially in low dose group After 45 days, the serum T3, T4 and T in the high dose group were not significantly different from those in the control group. Conclusion Subchronic oral exposure of electronic circuit board powder can cause liver injury in rats and increase serum T3, T4 and T contents.