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飞行时间次级离子质谱（ＴＯＦ－ＳＩＭＳ）结合Ｘ射线光电子能谱（ＸＰＳ）分析了用化学方法清洗后、银片上残留的未知的有机物。结果显示，有机沾污物主要是一些含１８～３０碳原子、碳链饱和度很高的酮类和酯类化合物；个别有机物可能是硬脂酰胺。这种结构特点使有机物中的Ｃ＝Ｏ基团易于采取氧原子指向基体表面的取向，通过带部分负电荷的氧原子与金属基体镜像力的作用而增强粘附。ＴＯＦ－ＳＩＭＳ二维离子像显示有机沾污物在银片表面上呈极稀薄的均匀分布。
Time-of-flight secondary ion mass spectrometry (TOF-SIMS) combined with X-ray photoelectron spectroscopy (XPS) was used to analyze the unknown organics remaining on the silver flake after chemical cleaning. The results show that organic contaminants are mainly ketones and esters containing 18-30 carbon atoms with high degree of carbon chain saturation. Some organic compounds may be stearic amide. This structural feature makes the C = O group in organic matter easy to take the orientation of oxygen atoms to the surface of the substrate, and enhance the adhesion by the effect of the partially negatively charged oxygen atoms and the metal substrate mirroring force. TOF-SIMS Two-dimensional ion images show that organic contaminants are extremely thin and evenly distributed on the surface of silver flakes.