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1.超细晶粒问题的提出超细晶粒在薄带材生产中具有非常实际的意义。一方面通过细化晶粒杜绝显微漏气,另一方面利用细晶的强度较高,来改善膜片成形拉深厚度的均匀性。本试验是针对厚度小于0.06m m带材制造的真空膜盒存在显微漏气问题提出的。材料为3 J 1,典型的膜片外形见附图,在图中可以看到外侧第二波纹(红线区)最易成形破裂的位置。分析认为造成显微漏气以及成形破裂的主要原因有两个:一是带料厚度较薄,晶粒大,易引
1. The issue of ultra-fine grain Ultra-fine grain in the production of thin strip has a very practical significance. On the one hand through the grain refinement to prevent micro-leaks, on the other hand the use of fine crystal strength is higher, to improve the uniformity of the thickness of the film forming depth. This test is for the thickness of less than 0.06m m vacuum tape cassette made of the existence of micro-leak problem. The material is 3 J 1. The typical diaphragm shape is shown in the attached figure. In the figure, it can be seen that the outermost second corrugation (red line region) is the most fractured position. Analysis that cause micro-leaks and forming fractures, there are two main reasons: First, the strip thickness is thin, large grains, easy to lead