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The quality of dark output images from the CMOS (complementary metal oxide semiconductor) black and white (B&W) digital image sensors captured before and after y-ray irradiation was studied. The characteristic parameters of the dark output images captured at different radiation dose, e.g. average brightness and its non-uniformity of dark output images, were analyzed by our test software. The primary explanation for the change of the parameters with the radiation dose was given.
The quality of dark output images from the CMOS (complementary metal oxide semiconductor) black and white (B & W) digital image sensors captured before and after y-ray irradiation was studied. The characteristic parameters of the dark output images captured at different radiation dose, eg average brightness and its non-uniformity of dark output images, were analyzed by our test software. The primary explanation for the change of the parameters with the radiation dose was given.