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模拟开关电源DC/DC模块内部电路为开关电源中的功率器件—垂直导电双扩散MOS(VDMOS)和肖特基二极管(SBD)—提供恒定电应力,并对其施加温度应力进行加速寿命试验。采用恒定电应力温度斜坡法(CETRM),对开关电源中功率器件VDMOS和SBD的可靠性进行评价;对其失效机理一致性进行分析,计算其失效激活能;并在失效机理一致的范围内外推正常使用条件下的寿命,为开关电源整体可靠性评价提供依据。
Analog Switching Power Supplies The internal circuitry of the DC / DC module provides constant electrical stress for power devices in vertical and vertical conduction double diffused MOS (VDMOS) and Schottky diodes (SBDs) and subjects them to temperature stress for accelerated life testing. The reliability of power devices VDMOS and SBD in switched-mode power supply was evaluated by constant electric stress temperature ramp method (CETRM). The consistency of failure mechanism was analyzed and its failure activation energy was calculated. The failure mechanism was also evaluated within the range of failure mechanism Under normal conditions of life, the overall reliability of switching power supply provides the basis for evaluation.