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在能量色散X射线荧光分析中,用实验方法直接测定样品的吸收系数,进行基体效应的校正是一类行之有效的方法。但以往都是根据某一特定能量的射线穿过样品时的吸收过程来测定吸收系数。本文利用样品中特征谱线强度随厚度变化的规律(饱和曲线)在中间层厚度下计算吸收系数。较直接地反映了样品特性。这不但对吸收效应的校正有效,而且在一定条件下对增强效应也有校正作用。 文章着重讨论了综合灵敏度因子KI_0的实际意义。并提出用实验方法测定KI_0和吸收系数μ从而进行“准绝对测量”的想法。 文章最后列举了不同情况下进行校正的实验结果,以证明方法的正确性。
In the energy dispersive X-ray fluorescence analysis, it is an effective method to directly measure the absorption coefficient of the sample by experiment method and carry out the correction of the matrix effect. In the past, however, the absorption coefficient was determined on the basis of the absorption of a particular energy ray as it passed through the sample. In this paper, the characteristics of the sample line with the thickness of the intensity changes with the law (saturation curve) in the middle layer thickness calculation of absorption coefficient. More directly reflect the sample characteristics. This not only validates the effect of absorption, but also corrects the enhancement effect under certain conditions. The article focuses on the practical significance of the comprehensive sensitivity factor KI_0. And put forward the idea of using the experimental method to determine the KI_0 and the absorption coefficient μ for “quasi-absolute measurement”. Finally, the article lists the experimental results under different circumstances to verify the correctness of the method.