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本文研究了用石墨粉抑制WO_3蒸发的机理和8种载体物质促进杂质元素蒸发以及增强谱线强度的效果,选择了最佳的载体和光谱测定条件。拟定了从含2％NaF的石墨粉为载体,采用WSP-2型光栅摄谱仪和直流电弧激发光谱,一次摄谱同时测定高纯WO_3中Al、As、Ba、Be、Bi、Ca、Cd、Co、Cr、Cu、Fe、Ga、Mg、Mn、Mo、Ni、Pb、Sb、Sc、Si、Sn、Ti、V、Y、Yb和Zr等28种杂质元素的直接光谱分析法。方法的测定下限0.003—3ppm,相对标准偏差5.4—30％,测定的最低杂质总量为19.263ppm。
In this paper, the mechanism of inhibiting the evaporation of WO_3 with graphite powder and the effect of eight kinds of carrier materials to promote the evaporation of impurity elements and enhance the intensity of the line were studied, and the optimum carrier and spectrometric conditions were selected. In this paper, the graphite powder with 2% NaF as the carrier, WSP-2 grating spectrograph and DC arc excitation spectroscopy were designed to simultaneously measure Al, As, Ba, Be, Bi, Ca and Cd in high purity WO_3 Direct spectroscopic analysis of 28 kinds of impurity elements such as Co, Cr, Cu, Fe, Ga, Mg, Mn, Mo, Ni, Pb, Sb, Sc, Si, Sn, Ti, V, Y, Yb and Zr. The method has a lower limit of 0.003-3ppm and a relative standard deviation of 5.4-30%. The lowest impurity content of the method is 19.263ppm.