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Transient thermal impedance of GaN-based high-power white light emitting diodes(LEDs) is created using a thermal transient tester.An electro-thermal simulation shows that LED junction temperature(JT) rises to a very low degree under low duty cycle pulsed current.At the same JT,emission peaks are equivalent at pulsed and continuous currents.Moreover,the diference in peak wavelength when a LED is driven by pulsed and continuous currents initially decreases then increases with increasing pulse width.Thus,selecting an appropriate pulse width decreases errors in JT measurement.
Transient thermal impedance of GaN-based high-power white light emitting diodes (LEDs) is created using a thermal transient tester. An electro-thermal simulation shows that LED junction temperature (JT) rises to a very low degree under low duty cycle pulsed current .At the same JT, emission peaks are equivalent at pulsed and continuous currents. More over, the diference in peak wavelength when a LED is driven by pulsed and continuous errors in JT measurement.