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内部杂散辐射抑制水平是评价红外成像系统的一项重要指标。由于内部杂散辐射与环境温度有关,其测量过程必须在多个环境温度下进行,存在成本高、时间长且实验设备要求高等缺点。针对上述问题,通过建立多积分时间定标模型,研究环境温度对内部杂散辐射的影响,提出一种采用环境温度测量制冷型红外成像系统内部杂散辐射的方法。该方法通过对制冷型红外探测器定标,获取探测器内部因素对系统输出的影响,结合系统在某一环境温度下的定标结果解算系统内部杂散辐射与环境温度的定量关系,进而计算系统在任意环境温度和积分时间下的内部杂散辐射。通过辐射定标实验验证该方法的有效性,实验结果表明该方法可以实现对制冷型红外成像系统内部杂散辐射的高精度测量。
The level of internal spurious radiation suppression is an important indicator for evaluating infrared imaging systems. Due to the internal stray radiation and the ambient temperature, the measurement process must be carried out in a number of ambient temperature, there is high cost, long time and high requirements of the experimental equipment. In order to solve the above problems, a multi-integration time calibration model was established to study the effect of ambient temperature on internal stray radiation. A method for measuring stray radiation in a refrigerated infrared imaging system using ambient temperature was proposed. In this method, the influence of detector internal factors on the output of the system is obtained by calibrating the refrigerant infrared detector. The quantitative relationship between the system internal spurious radiation and the ambient temperature is solved by the calibration results of the system at an ambient temperature. Calculate the system’s internal spurious emissions at any ambient temperature and integration time. The effectiveness of this method is verified by radiation calibration experiments. The experimental results show that this method can achieve high-precision measurement of stray radiation in a refrigeration infrared imaging system.