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通过对半导体激光器辐射效应的分析,得到了器件在空间环境中的损伤规律和退火规律。根据辐射效应的特点,将器件的性能退化表示为泊松过程与指数过程的结合,建立了基于马尔科夫过程的可靠性模型,利用一步概率转移矩阵获得了故障概率分布函数、可靠度函数以及平均故障前时间的计算方式。根据已有数据,对半导体激光器在空间辐射环境中的性能退化过程进行了仿真,得到了总测试时间为100 000h时器件的故障概率分布曲线,计算得出平均故障前时间约为42 758.9h,此时器件可靠度为0.451。分析了不同时间条件下器件的状态概率分布律,结果符合器件性能退化的一般规律,能够描述出器件的失效过程。
By analyzing the radiation effects of the semiconductor laser, the damage rules and annealing rules of the device in the space environment are obtained. According to the characteristics of the radiation effect, the performance degradation of the device is expressed as the combination of Poisson process and exponential process. The reliability model based on Markov process is established. The probability distribution function, the reliability function, The average pre-failure time is calculated. According to the available data, the performance degradation of semiconductor laser in space radiation environment was simulated, and the fault probability distribution curve of the device was obtained when the total test time was 100 000 h. The calculated average failure time was about 42 758.9 h, At this point the device reliability is 0.451. The state probability distribution law of devices under different time conditions is analyzed. The results accord with the general rules of device performance degradation and describe the device failure process.