论文部分内容阅读
本文介绍了非晶光电导材料漂移迁移率的测试和信号典型波形.分析了测试系统中对所测微弱信号的干扰情况,并对干扰源的衰减抑制以及降低和消除噪声的方法作了介绍.
This paper introduces the test of drift mobility of amorphous photoconductive materials and the typical waveform of the signal, analyzes the interference of the measured weak signal in the test system, and introduces the attenuation of the interference source and the method of reducing and eliminating the noise.