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美国国家标准局表面科学研究室主任鲍威尔(C·J·Powell)博士应上海市标准计量局测试技术研究所邀请,于84年5月22日至6月8日来沪作“电子能谱表面分析”讲学座谈。参加者有全国拥有电子能谱仪的25个单位的代表。讲座系统地讲述了AES、XPS、APS、EELS等表面分析技术,芯电子结合能精确测定,AES、XPS定量问题、深度剖析等内容。鲍威尔博士系美国材料测试学会(ASTM)表面分析专业委员会(E-42委员会)主任
At the invitation of Shanghai Institute of Testing Technology, Bureau of Standards and Metrology, Dr. C. Powell, Director of the Surface Science Laboratory of the US National Bureau of Standards, came to Shanghai from May 22 to June 8, Analysis "lecture discussion. The participants are representatives of 25 units nationwide that have electronic spectrometers. Lectures systematically described the AES, XPS, APS, EELS and other surface analysis techniques, core electronic binding can be accurately measured, AES, XPS quantitative problems, depth analysis and so on. Dr. Powell is the director of the American Society for Testing and Materials (ASTM) Surface Analysis Professional Committee (E-42 Committee)