论文部分内容阅读
戽链(BBD)结构的CMOS红外模拟TDI探测器,由于其兼容普通CMOS工艺,并可以提高系统的信噪比,因而在空间遥感领域得到了广泛的应用。而基于焦平面面阵的数字TDI(Digital Time Delay and Integration)技术的研究与应用尚在起步阶段。利用中国生产的320×256中波面阵红外探测器进行DTDI研究,对比分析了模拟TDI探测器的电子转移效率、BBD噪声、动态范围等方面的性能,突出了DTDI在结构和性能上的优势,并通过理论推导了DTDI对面阵探测器本身信噪比的提高,非均匀性的改善,同时分析了DTDI过程中盲元对性能的影响。最后,通过实验得到了16级DTDI的信噪比增加为2.5倍,非均匀性减少到1.68%,验证了DTDI技术对系统性能的改善,为DTDI技术的应用提供了理论参考。
The infrared analog TDI detector with BBD structure has been widely used in the field of space remote sensing due to its compatibility with common CMOS technology and the improvement of signal-noise ratio of the system. The research and application of digital TDI (Digital Time Delay and Integration) based on focal plane array are still in the initial stage. DTDI was studied by using 320 × 256 medium wave surface area infrared detector produced in China. The performance of DTDI detector in terms of electron transfer efficiency, BBD noise and dynamic range was compared and analyzed. The structural and performance advantages of DTDI were highlighted. The theory of DTDI is used to deduce the improvement of signal to noise ratio and inhomogeneity of DTDI, and the influence of blind element on performance of DTDI is also analyzed. Finally, the SNR of 16-level DTDI is increased by 2.5 times and the nonuniformity is reduced to 1.68%. The DTDI technology verifies the improvement of system performance and provides a theoretical reference for the application of DTDI technology.