论文部分内容阅读
We investigate the dominant dark current transport mechanism in Si based p–i–n photodiodes, namely,BPW 21R, SFH 205FA and BPX 61 photodiodes in the temperature range of 350 to 139 K. The forward current–voltage characteristics of these photodiodes are explained via the tunneling enhanced recombination model, which gives a quantitative description of the electronic mechanism in the p–i–n junction photodiodes. The observed temperature dependence of the saturation current and the diode ideality factor of these devices agree well with theoretical predictions; the analysis also indicates the importance of doping for enhancement of tunneling. The present study will be helpful in applying the devices at low temperature ambience.
We investigate the dominant dark current transport mechanism in Si based p-i-n photodiodes, namely, BPW 21R, SFH 205FA and BPX 61 photodiodes in the temperature range of 350 to 139 K. The forward current-voltage characteristics of these photodiodes are explained via the tunneling enhanced recombination model, which gives a quantitative description of the electronic mechanism in the p-i-n junction photodiodes. The observed temperature dependence of the saturation current and the diode ideality factor of these devices agree well with theoretical predictions; the analysis also present the importance of doping for enhancement of tunneling. The present study will be helpful in applying the devices at low temperature ambience.