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本文叙述了用X射线衍射法测定Ga_(1-x)1n_xAs/GaAs结构中X值的原理和方法。将所得结果与电子探针法进行了比较,并对测试中的几个问题进行了讨论,提出了初步的看法。
This paper describes the principle and method of X-ray diffraction of Ga 1-x 1n_xAs / GaAs by X-ray diffraction. The results were compared with the electronic probe method, and the test of several issues were discussed, put forward a preliminary view.