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In SEE ground simulation experiments, wide beam whose size is similar to the ICs can be used for measuring the Single-Event Effects (SEE) cross section curves but can’t be used for measuring the SEE sensitivity of different regions. To study the SEE mechanism of different regions of the ICs, micro beam
In SEE ground simulation experiments, wide beam whose size is similar to the ICs can be used for measuring the Single-Event Effects (SEE) cross section curves but can not be used for measuring the SEE sensitivity of different regions. To study the SEE mechanism of different regions of the ICs, micro beam