本文为T1—58C和T1—59型可编程序计算器编制一套计算程序,应用于有择尤取向试样的X射线定量分析;并分别采用了Gullberg多线条法以及Mueller和Horta反极图法对Si和ZnO压制试样中Si的衍射强度进行校正,用Zevin无标样法进行定量测定,获得了满意的结果,使繁琐的计算能在几分钟内完成,具有一定的实用价值。 In this paper, a set of calculation program is compiled for T1-58C and T1-59 programmable calculators, which are applied to X-ray quantitative analysis of selective samples. Gullberg multi-line method and Mueller and Horta reverse polar diagrams Method was used to calibrate the diffraction intensity of Si in Si and ZnO pressed samples. The Zevin standard sample method was used for quantitative determination. Satisfactory results were obtained and the cumbersome calculation could be completed in a few minutes. This method has certain practical value.