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用飞行时间二次离子质谱(TOF-SIMS)结合X射线光电子能谱,分析了用化学方法清洗后银片上残留的未知有机物.TOF-SIMS与XIPS提供的互补的表面信息显示,中分子量以上的有机物主要是几种链长22～27碳原子、碳链饱和度很高的多酮类化合物,可能还有一些多酯类化合物.这些有机物中的C=O基团易于采取氧原子指向金属基体表面的取向,通过带部分负电荷的氧原子与金属基体镜像力的作用而增强粘附.
The TOF-SIMS and X-ray photoelectron spectroscopy (XPS) were used to analyze the unknown organic residues on the silver flakes after chemical cleaning.The complementary surface information provided by TOF-SIMS and XIPS showed that the surface area Organics are mainly polyketides with a chain length of 22-27 carbon atoms and high degree of carbon chain saturation, possibly with some polyesters. The C = O groups in these organics are apt to take oxygen atoms to the metal matrix The surface orientation enhances adhesion by the effect of partially negatively charged oxygen atoms and the metallic substrate mirroring force.