本文的目的是说明对存储器和 MSI/LSI 器件时间测试的要求。这些器件即使通过了功能和参数二种测试,如果不满足某些适当的时间要求,那么它们实际上仍然得不到应用。在存储器中,包括芯片选择、读出访问和写入访问在内的访问时间的测量和数据、芯片选择、地址建立以及保持的时间关系一样部是非常重要的。MOS 器件也必须在最大的时间范围内满足给定的功能。为了提供某些有关的和基本的资料。先调查一下普通半导体存储器器件(RAM)以及它们的时间 The purpose of this article is to demonstrate the requirements for time testing memory and MSI / LSI devices. Even though these devices pass both functional and parametric tests, they still can not actually be used if they do not meet some of the appropriate timing requirements. In memory, the measurement of access time, including chip select, read out, and write access, is as important as the data, chip select, address build, and hold time relationships. MOS devices must also meet a given function over the maximum time frame. In order to provide some relevant and basic information. First look into common semiconductor memory devices (RAMs) and their time