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日本川崎制铁技术研究所最近研制成功一种有可能在生产线中连续测定钢板极薄镀膜厚度的测量方法.其测量原理如图所示。在光学常数为 N_2=n_2-K_2i(这里i=(-1)~(1/2))的金属表面复盖有一层光学常数为 N_1=n_1-K_1i 的氧化膜,其厚度为 d,有一束波长为λ的光从折射率为n_0的介质以入射角 _0射入,这束光在边界 S_1和 S_2处按照斯奈耳定律和反射定律经受多次折射和反射,其振幅和相位均会发生变化。
Japan Kawasaki Institute of Technology recently developed a successful technology may be in the production line for the continuous determination of the thickness of the plate extremely thin coating measurement method.The measurement principle shown in Figure. A metal oxide film with an optical constant N_1 = n_1-K_1i is covered on a metal surface with an optical constant N_2 = n_2-K_2i (i = (- 1) ~ (1/2) Light having a wavelength of λ is incident at an incident angle of _0 from a medium of refractive index n_0 which undergoes multiple refraction and reflection at the boundaries S_1 and S_2 according to Snell’s law and the law of reflection with amplitude and phase both Change.