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本法采用粉末直接压片制样,X射线荧光光谱法快速、准确地测量了从0.10～99.90%变化的氧化钕、氧化钐含量。精密度优于1.0%。本法着重研究了不同数学模型在该法中的应用效果。
This method uses powder direct compression sample preparation, X-ray fluorescence spectrometry fast and accurate measurement of the change from 0.10 to 99.90% of neodymium oxide, samarium oxide content. Precision better than 1.0%. This law focuses on the application of different mathematical models in this method.