论文部分内容阅读
胚胎硬件的高可靠性主要由新颖的硬件体系和细胞电路结构来保障,缺乏应用设计过程的可靠性提高方法研究。分析了在应用设计过程中可调的胚胎硬件可靠性影响因素,针对细胞单元粒度不同会导致细胞面积变化从而影响细胞阵列可靠性的实际情况,对传统可靠性模型无法体现细胞面积变化的不足进行了改进,建立了新的可靠性模型。通过实例分析,总结出不同细胞单元粒度情况下的细胞阵列可靠性变化规律,进而给出细胞单元粒度优化选择方法,设计者基于该方法不需设计完整电路就能确定自身设计能力范围内获得最大可靠性的细胞单元粒度。
The high reliability of the embryo hardware is mainly guaranteed by the novel hardware system and the cell circuit structure, and there is a lack of research on the reliability improvement method of the application design process. The influencing factors of hardware reliability of adjustable embryo in application design are analyzed. In view of the actual situation that cell size changes due to different cell size, which affects the reliability of cell array, the deficiency that the traditional reliability model can not reflect the change of cell area is analyzed Improved, established a new reliability model. Through the example analysis, the variation of cell array reliability with different cell size was summarized, and then the optimal selection method of cell size was given. Based on this method, the designer can determine the maximum gain within its design capability without designing a complete circuit Reliability Cell Cell Size.