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目的:初步探讨MM50一维电磁扫描调强。方法:利用MM50独特的计算机扫描调制和聚焦系统,研究MM50六边形扫描模式和圆形扫描模式。通过改变扫描模式研究一维适形调强方面的特点,将50MVX射线和电子线的扫描楔形分布实测的离轴曲线与理论曲线做对比分析。结果:实测曲线与理论曲线吻合良好。50MVX射线的扫描楔形分布,在楔形方向上的最大误差为1%,在对称方向上的最大误差为3%。50MeV电子线的楔形分布,计算结果与测量结果的差别小于2%。讨论:说明用MM50扫描束可获得较好的调强效果。
Objective: To investigate the MM50 one-dimensional electromagnetic scanning intensity. Methods: Using MM50’s unique computerized scanning modulation and focusing system, the MM50 hexagonal scanning mode and the circular scanning mode were studied. By changing the scanning mode to study the characteristics of one-dimensional conformal modulation, the measured off-axis curves of the measured wedge-shaped distribution of 50MV X-ray and electron beam are compared with the theoretical curve. Results: The measured curve is in good agreement with the theoretical curve. The scanning wedge-shaped distribution of 50 MVV rays has a maximum error of 1% in the wedge direction and a maximum error of 3% in the symmetrical direction. 50MeV electronic wire wedge distribution, the calculated results and the difference between the measured results is less than 2%. Discussion: Description MM50 scanning beam can get a better intensity adjustment effect.