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介绍了纳米TiO_2表面组成、微结构分析技术近年来的进展。光电子能谱技术包括X光电子能谱(XPS)和俄歇光电子能谱(AES):光谱分析技术包括红外光谱(IR)和Raman光谱;显微分析技术中有扫描隧道显微镜(STM),原子力显微镜(AFM)及扫描和透射电子显微镜(SEM、TEM);X射线分析技术主要是X射线衍射(XRD)。
The surface composition of nano-TiO 2 and the progress of micro-structure analysis technology in recent years are introduced. Photoelectron spectroscopy includes X-ray photoelectron spectroscopy (XPS) and Auger photoelectron spectroscopy (AES): spectroscopic techniques include infrared spectroscopy (IR) and Raman spectroscopy; microscopy techniques include scanning tunneling microscopy (STM), atomic force microscopy (AFM) and scanning and transmission electron microscopy (SEM, TEM); X-ray analysis technology is mainly X-ray diffraction (XRD).