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一、概述 CPU的测试是一个复杂问题。它既非逻辑门电路的简单集合,也没有存储器那样规整的结构。很难用一个简单的故障模型,来分析、检测CPU的失效模式。它具有上一代一些小型计算机的全部特点。但是,结构上的限制,不可能深入到芯片内部的每一节点,检测故障所在,使得故障的可控制性与可观察性大大降低。这些都给CPU测试带来很多困难。然而,CPU的可编程特征,却为用户提供了测试CPU功能的有利途径。尽管CPU的构成相当复杂,但整个CPU还是可以看作一个执行一系列基本操作的晶体管门的集合,
First, an overview of the CPU test is a complex issue. It is neither a simple collection of logic gates nor a structured structure of memory. It is difficult to use a simple fault model to analyze, detect CPU failure mode. It has all the features of some of the previous generation of small computers. However, the structural limitations, it is impossible to go deep into each node within the chip to detect the fault, making the fault controllability and observability greatly reduced. These are CPU test to bring a lot of difficulties. However, the CPU’s programmable features give users an advantageous way to test CPU functionality. Despite the rather complex CPU configuration, the entire CPU can be thought of as a collection of transistor gates that perform a series of basic operations,