论文部分内容阅读
用分析透射电镜H-800的SEI附件观察了多种钢铁薄膜样品,看到了在薄膜表面的碳化物和其它第二相的二次电子象。这些薄膜样品是供主机TEM进行衍衬观察的合格样品,用高氯酸乙醇溶液双喷射电解减薄法制备。本文探讨了引起二次电子象衬度的原因及影响成象质量的操作因素,并将二次电子象与衍衬象进行比较。指出这种观察方法可以作为衍衬法的一种补充,以便取得有关钢铁材料中第二相分布与形态学的更多资料。
A variety of steel film samples were observed using the SEI accessory for analyzing the transmission electron microscope H-800 and the secondary electron image of the carbide and other secondary phases on the film surface was seen. These thin film samples were qualified samples for the host TEM observation of the diffraction and were prepared by dual jet electroforming with an ethanol perchlorate solution. In this paper, the reasons for the secondary electron image contrast and the operating factors affecting the image quality are discussed. The secondary electronic images are compared with the derivative images. It is pointed out that this observation method can be used as a supplement to the derivative method in order to obtain more information about the distribution and morphology of the second phase in the steel material.