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由IEEE计算机协会测试技术委员会和IEEE费城分部联合主办的九五国际测试年会(95’ITC),于1995年10月21日—26日在美国华盛顿举行。与会的有2500余人。这是在系统测试、PCB测试和IC测试方面最重要的国际会议之一。会议包括四部分:第一部分为Tu-torials,有16个Tutorial;第二部分为会议报告,分46个Session,宣读论文125篇;第三部分为专题讨论;第四部分为展览会。展览会上有86个厂商展出了他们最先进的测试设备和测试软件。这次会议一个比较中心的议题是可测性设计。从目前发展情况看,设计与测试是两个不可分割的统一体,测试一定要在设计阶段就有所考虑,并在设计时“埋入”测试部件。测试用来检测一个电路的好坏和性能,同时用以解决故障检测和故障定位问题。测试通常可分为两个主要方面,即测试产生和测试验证。
The 95th International Test Conference (95’ITC), jointly organized by the IEEE Computer Society of Testing and Technology Committee and the IEEE Philadelphia Division, was held in Washington, DC from October 21 to 26, 1995. More than 2,500 people attended the event. This is one of the most important international conferences in system testing, PCB testing and IC testing. The conference consists of four parts: the first part is Tu-torials, which has 16 Tutorials; the second part is the report of the conference, which consists of 46 sessions and 125 papers; the third part is the thematic discussion; the fourth part is the exhibition. 86 exhibitors at the show exhibited their most advanced test equipment and test software. One of the more central topics at this conference is the design of testability. From the current development situation, design and testing are two indivisible unity, the test must be considered in the design phase, and in the design “embedded ” test components. The test is used to detect the quality and performance of a circuit, and to solve the problem of fault detection and fault location. Tests usually fall into two main areas, test generation and test verification.