论文部分内容阅读
本文提出了一种新的,能够产生电流控制型负阻特性的CMOS集成电路结构,并进行了理论分析,导出了负阻特性的特征参数表达式.实验结果与理论分析满意一致.
In this paper, a new structure of CMOS integrated circuit that can generate current-controlled negative resistance is proposed and theoretically analyzed, and the characteristic parameter expression of negative resistance is deduced.The experimental results are in good agreement with the theoretical analysis.