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本文通过实验的方法分析研究了不同高阶模滤除条件对ITU-T G.657.A2、A3和ITU-T G.657.B3类光纤模场直径测量结果的影响。实验表明,采用22m试样光纤的测试条件或采用将2m标准的G.652光纤熔接在2mG.657试样光纤上,并在标准的G.652光纤上绕两个40mm半径圈的测试条件均可以准确测试G.657.A类包括A3类和G.657.B类光纤在1310nm处的模场直径。采用其他不同的弯曲半径或通过绕更多圈的滤除高阶模的方法并不总能够有效滤除G.657.A类包括A3类和G.657.B类2m试样光纤中的高阶模。特别是弯曲性能好且λc≥1310nm的G.657光纤,1310nm处模场直径测试的结果会受高阶模影响,并导致实测值比正确值偏小。为了避免高阶模的影响,推荐采用22m试样光纤测试条件或采用将2mG.652光纤熔接在2mG.657试样光纤上,并在G.652光纤上绕两个40mm半径圈的测试条件测试G.657光纤1310nm处模场直径。
In this paper, the effect of different high-order mode filtering conditions on the mode-field diameter measurements of ITU-T G.657.A2, A3 and ITU-T G.657.B3 optical fiber has been analyzed experimentally. Experiments show that the use of 22m sample optical fiber test conditions or the use of 2m standard G.652 fiber fusion on 2mG.657 sample optical fiber and the standard G.652 fiber around two 40mm radius test conditions G.657 can be accurately tested. Category A includes the mode field diameter at 1310 nm for Class A3 and G.657.B fibers. The use of a different bend radius or by filtering higher order modes around more turns does not always effectively filter out G.657.A class includes higher order modes in Class 2 and G.657.B class 2m sample fibers. Especially for the G.657 fiber with good bending performance and λc≥1310nm, the result of the mode field diameter test at 1310nm will be affected by the higher-order mode and lead to the measured value being smaller than the correct value. In order to avoid the effect of higher order mode, it is recommended to use 22m sample optical fiber test conditions or test the G with 2mG.652 optical fiber fused to 2mG.657 sample optical fiber and two 40mm radius laps around G.652 optical fiber. 657 fiber mode field diameter at 1310nm.