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利用原子力显微镜对碳纳米管进行微操纵研究。首先,选择出适合系统使用的基底;然后,在基底上利用原子力显微镜接触模式,成功地对碳纳米管束进行了推动、切割和弯曲等操纵;最后,讨论了影响微操纵的一些系统参数,总结出该系统微操纵的适合参数为:参考点4.0~5.0,扫描频率20 Hz~50 Hz。该研究为微/纳米机械装配技术的发展进行了有益的探索。
Micromanipulation of carbon nanotubes using atomic force microscopy. First, we choose a suitable substrate for the system. Then we use AFM contact mode on the substrate to successfully drive, cut and bend the carbon nanotube bundles. Finally, we discuss some system parameters that affect the micromanipulation. The appropriate parameters for micromanipulation of the system are: reference point 4.0 ~ 5.0, scanning frequency 20 Hz ~ 50 Hz. The research is beneficial to the development of micro / nano mechanical assembly technology.