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带冗余的集成电路的成品率的估计对制造者来说是一个非常重要的问题。文中将集中分析和讨论带冗余的成品率模型和可靠性，给出了该领域研究进展的最新结果，并指出了进一步研究的方向和策略。
Yield estimates for integrated circuits with redundancy are a very important issue for manufacturers. The article will focus on analysis and discussion with redundancy yield model and reliability, given the latest research results in this area, and pointed out the direction and strategy for further research.