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数字电路的可靠性有着至关重要的影响,测试是其重要保证,测试向量的自动生成(ATPG)在数字电路的测试中占有重要地位;逻辑表达式图(Boolean Expression Diagrams,BED)是用于逻辑函数与逻辑电路表达与运算一种数据结构,能够将逻辑电路在线性空间复杂度内表达,是二元判决图(Binary Decision Diagrams,BDD)在概念上的推广且保留着BDD的许多有用的性质。讨论了BED的性质与实现方法,并将BED用于逻辑电路呆滞型故障测试向量的自动生成中,基于BED的测试算法直接将原电路与故障电路做异或运算后用BED表达再化简或判断其可满足性,算法能充分使用逻辑代数的化简规则和利用电路与故障电路的相似性。实验结果表明,基于BED的测试方法具有较低的复杂度。
The reliability of digital circuits is of crucial importance. Testing is an important guarantee. The automatic generation of test vectors (ATPG) plays an important role in the testing of digital circuits. The Boolean Expression Diagrams (BED) Logical Functions and Logic Representation and Computation A data structure that expresses logic within the linear space complexity and is useful for conceptual extension of and maintenance of BDD nature. The nature and implementation of BED are discussed. BED is used in the automatic generation of test logic of dumb type fault in logic circuit. The test algorithm based on BED directly scans the original circuit and the fault circuit by XOR, To judge its satisfiability, the algorithm can make full use of the simplification rules of logical algebra and the similarities between the circuit and the faulty circuit. The experimental results show that the BED-based test method has a lower complexity.