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当特征X射线能量较小时,吸收曲线在薄层范围内斜率很大。利用这一特点来测定薄层吸收体的厚度具有很高的灵敏度。文章阐述了这一方法的原理、计算方法和实验技术。实验数据证实了有关理论分析的正确性和可行性。
When the characteristic X-ray energy is small, the absorption curve has a large slope in the thin layer. The use of this feature to measure the thickness of the thin absorber has a high sensitivity. The article expounds the principle, calculation method and experimental technique of this method. The experimental data confirm the correctness and feasibility of the theoretical analysis.