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双侧向测井仪传统上被广泛地用来探测地层电阻率剖面。本文指出了这种传统测井方法的某些不足,介绍了一种新设计的仪器——阵列侧向测井仪。用有限元法模拟了双侧向测井仪和阵列侧向测井仪在各种地层模型中的视电阻率曲线。数值研究结果表明,阵列侧向测井仪比双侧向测井仪具有更高的纵向分辨率和更灵活的径向探测深度。由于采取新的独特的电极排列方式,阵列侧向测井仪在理论上可以测得无限量的浅视电阻率曲线。每条曲线都具有同深阵列侧向测井(ALD)大致一样高的纵向分辨率,但其探测深度各异。浅阵列侧向测井(ALS)曲线与深阵列侧向测井(ALD)曲线结合,可提供全径向地层电阻率剖面。
Bilateral logging tools have traditionally been widely used to detect formation resistivity profiles. This paper points out some shortcomings of this traditional logging method, and introduces a newly designed instrument - array lateral logging tool. The apparent resistivity curves of the double lateral logging tools and the array lateral logging tools in various stratigraphic models are simulated by finite element method. The numerical results show that the array lateral logging tool has higher vertical resolution and more flexible radial detection depth than the dual lateral logging tools. Due to the new and unique arrangement of electrodes, the array lateral logging tool theoretically can measure an infinite amount of superficial resistivity curves. Each curve has approximately the same vertical resolution as the deep array lateral log (ALD), but with varying depths of exploration. Combined with a shallow array lateral log (ALS) curve and a deep array lateral log (ALD) curve, a full radial formation resistivity profile can be provided.